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Our Bruker Nanowizard 4 XP BioAFM system is mounted on an Olympus IX73 inverted fluorescent microscope. It combines high resolution, fast scanning, and a large range of 100 um in one system, paired with user-friendly software that enables a logical progression when performing tasks. It is configured to capture quantitative measurements of biomechanical properties from molecules, cells, and tissues in a temperature controlled, fluid environment.
Key Features
Key Features
Atomic lattice resolution on inverted microscope in closed-loop
Ultra-low noise level of cantilever deflection detection system
Tip-scanning, stand-alone system with a rigid low-noise design and drift-minimized mechanics
Liquid-safe AFM with integrated vapor barrier, special encapsulated piezo drives, and tip-moving design
Scanner unit
100 x 100 x 100 μm3 scan range
Sensor noise level <0.09 nm RMS in xy
0.04 nm RMS sensor noise level in z
Controlled with the state-of-the-art Vortis 2 digital controller
Easy, workflow-based SPMControl software
A wide range of operating modes including PeakForce Tapping, Contact mode with lateral force microscopy (LFM), Tapping Mode with PhaseImaging, Static and dynamic spectroscopy, Advanced Force Mapping, and QI Advanced Mode.
See Bruker.com for more information about the Nanowizard 4 XP system
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